School of Mechanical Engineering 专业(Program):仪器科学与技术
Instrument Science and technology
Semiconductor detection technology
Mechatronics and instrument design 联系方式(Contact Information)
Sep,2000-Dec,2003, Hebei University of Technology, microelectronic technology， Doctor's Degree
Sep,1996-Jun,1998, Tianjin University， Management Engineering, Master's Degree
Sep,1980-Jul,1984, Hebei University of Technology, Tractor, bachelor's degree
4.2009/9-2010/8，State University of New York at Binghamton，Thomas J.
Watson School of Engineering and Applied，Senior visiting scholar
1.2014/7-present, Hebei University of Technology, School of mechanical engineering, measurement and control technology and instrument department, Institute of modern measurement and control technology, Professor
2.2013/8-2014/7, visiting professor, Department of mechanical engineering, National Chin-Yi University of Technology,
3.2010/9-2013/8, Hebei University of Technology, School of mechanical engineering, measurement and control technology and instrument department, Institute of modern measurement and control technology, Professor
4.2009/9-2010/8, State University New York Binghamton at, Thomas of J.
Watson School Engineering and Applied, Senior visiting scholar of
5.2006/11-2009/9, Hebei University of Technology, School of mechanical engineering, measurement and control technology and instrument department, Institute of modern measurement and control technology, Professor
6.2005/11-2006/11, Hebei University of Technology, School of mechanical engineering, measurement and control technology and instrument department, Institute of modern measurement and control technology, associate professor
Associate Professor, College of Mechanical Engineering, Hebei University of Technology, Tianjin, P.R. China, 2003/12 to 2006/10.
Undergraduate courses taught:
• The technology and system of measurement and control ,
• The principle and application of sensor ,
• The principle and application of single chip computer
• The basis of modeling design in industrial products
• Entrepreneurship education.
Graduate courses taught:
• The techniques of modern internet
Research Associate, Semiconductor Testing Institute of Technology, Hebei University of Technology, Tianjin, P.R. China, 1999/09-2003/12.
• Consulting on single-chip computer test
• Advising students in three research areas including micro-electronics technology, equipment science, and technology areas.
• Completed projects:
o The application of location technology of image recognition in the micro-thin four-probe resistance mapping (achievement register No. 20040055), Natural Science Foundation project awarded by Tianjin.
o The application of image recognition in the micro-testing using four-probe positioning technology (achievement register No. 20040704), Natural Science Foundation project awarded by Hebei Province.
o The theory and application of four-probe in Semiconductor testing technology, Ministry of Education’s project (achievement register No. 360-06-15170452-02) People's Republic of China.
o Design of new equipment for testing the resistance of semiconductor wafer.
Engineer, Mechatronic Engineering Center, Machine Tool Plant of Hebei University of Technology, Tianjin, P.R. China, 1987/09-1999/08,
• Development of a series of semi-automatic and fully automatic lathes for turning bearing rings with hydraulic-driven and PLC controller.
• Development of semi-automatic lathe for turning the Motor Cover with hydraulic-driven and PLC controller.
• The development of automatic processing lines for turning small bearing rings, design of driving equipments with feeding auxiliary.
• The design of major structure of a series of machine tools.
• The design of hydraulic-driven system in lathe of turning bearing rings.
• Design of the main drive system in the series dedicated lathe for turning bearing rings.
• The development of HZC20 automatic lathe series for bearing rings,1993, third place of scientific and technological progress awarded by Hebei Province.
Assistant Lecturer, Department of Mechanical Engineering, Hebei University of Technology, Tianjin, P.R. China, 1984/07-1987/08
Responsibilities: Student advising and management
学术兼职:(Part-time Academic Jobs)
Modern instruments and medical services, member of the editorial board
Evaluation experts of the Ministry of education, degree and graduate education evaluation center.
Visiting professor, Taiwan National Chin-Yi University of Technology
1. 刘新福，张剑军，朱志辉等，微区电阻率测试中的快速获取Mapping 技术研
06213544），河北省科技厅计划项目， 2013.12, 已完成。
3. 刘新福，张润利，刘金河等. 硅片薄层电阻测试技术研究，国际先进，2012
1 Liu Xinfu,, Zhu Zhihui, et al. Rapid acquisition of Mapping in micro area resistivity test Research, No: C2013005003, Hebei Provincial Department of human resources and social security, Hebei province high-level talent funding projects funded by merit, 2014.01-2016.12, has been completed.
2 Liu Xinfu, Zhang Runli, et al. Study on the technology of measuring the resistance of the thin layer in the large scale silicon wafer (No.
06213544), Hebei provincial science and technology department project, 2013.12, has been completed.
3 Liu Xinfu, Zhang Runli, et al. Research on testing technology of silicon chip resistance, international advanced,, 2012
In July 2005, the Hebei provincial science and Technology Department (20121667).
4 Runli, Liu Xinfu, research on handling machinery for hydrostatic system and control scheme, 2012 June identified by the Hebei provincial science and Technology Department, the leading domestic.
5 Liu Xinfu. Principle and application of semiconductor testing technology, Tianjin Institute of science and technology, Monograph fund project, starting and ending time 2006.01-2007.01, has been completed.
• Research on Resistance Testing Technology for Large-scale Micro-thin Layer of Silicon.Science and Technology Department Guidance Projects Awarded by Hebei Province.
• The Application of Location Technology of Image Recognition in the Micro-thin film Resistance Mapping (Achievement Register No. 20040055), Natural Science Foundation Project Awarded by Tianjin.
• The Application of Image Recognition in the Micro-testing Four-point--probe Positioning Technology (Achievement Register No. 20040704), Natural Science Foundation Project Awarded by Hebei Province.
• The Theory and Application of Four-point-probe in Semiconductor Testing Technology, Ministry of Education’s Project (Achievement Register No. 360-06-15170452 02) People's Republic of China.
• Research Project on the Testing Technology of Silicon Sheet Resistance ( No.2006449), Office of Education’s Project in Hebei Province.
请列举5篇左右代表性论文或著作。(Please list 5 representative publications)
ISBN978-7-5024-5188-2，24 万字，冶金工业出版社，2010 年5 月
2. 刘新福， 杜占平， 李为民编著. 半导体测试技术原理与应用[M] ，
ISBN978-7-5024-4101-2，26.7 万字，冶金工业出版社,2007 年1 月
1. Wu Pengfei, Liu Baodong, Liu Xinfu*. Sheet Resistance Mapping Technique Method Based
on Polar Coordinates, 2016 IEEE International Symposium on Computer, Consumer and
Control， Xian,China, July 4-6, 2016:994-997
2. Liu Baodong,Wu Pengfei, Liu Xinfu*. Micro-area Sheet Resistance Measurement System of
Four-Point Probe Technique Based on LabVIEW, 2016 IEEE International Symposium on
Computer, Consumer and Control，Xian,China, July 4-6, 2016:999-1001
3. Zhao Junpeng, Liu Xinfu*. Research on PID Controller for Hydraulic Servo System Based on
LabVIEW, 2015 IEEE International Conference on Fluid Power and Mechatronics, August 5-7,
4. LIU Liping , LIU Xinfu*,GONG Yujie, Huan Guo. Fuzzy PID control srstem for hose pulse
experiment based on LabVIEW,Journal of Measurement Science and Instrumentation
（ISSN1674- 8042), Vol.6 No.2,Jun.2015:161--168
5. Zheng Chen, Xinfu Liu*, Runli Zhang. An automotive electronic throttle testing equipment
Based on STM32，IEEE International Symposium on Computer, Consumer and Control,
Taichung, Taiwan, June 10-12, 2014:478-481,IEEE, indexed by EI，ISTP.
6. Liu Xinfu, Du Zhanping, and Li Weimin. The Principal and Application on Measurement Technique of Semiconductor, Metallurgical Industry Press, ISBN978-7-5024-4101-2,2007.01.
7. Liu Xinfu ,Sun Yicai ,Zhang Yanhui etc. The Measurement of Square Resistance for Microarea by Square Four-Probe Techniques and Using a Modified Rymaszewski's Rormula. Acta Physica Sinica.2004,Vol 53,No8:2461-2466, Indexed by SCI.
1. Sun Yicai, Liu Xinfu, Meng Qinghao. Intelligent processing and fusion nonlinear signal sensor [M],ISBN978-7-5024-5188-2, metallurgical industry press, May 2010
2. Liu Xinfu, Du Zhanping. Principle and application of semiconductor testing technology [M],ISBN978-7-5024-4101-2, metallurgical industry press, January 2007